Studies

RF power transistors behave differently under DC bias than under real RF operation. Why pulsed IV characterization has become essential for accurate nonlinear modeling.

When testing power transistors, even a short DC sweep can cause the device to heat up quickly. That heat shifts the electrical behavior—especially on key parameters like on-resistance (RDS(on)).

Active antennas have brought a paradigm shift in modern communication systems.

AMCAD proposes now to combine the advantage of both solutions using one innovative tool.