AMCAD and ITEST at Power Electronics International 2026
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AMCAD and ITEST at Power Electronics International 2026
Power Electronics International takes place next week, from April 20 to 22 in Brussels. AMCAD and ITEST will be present as Gold Sponsors on a shared booth, covering the full range of test and characterization solutions for power semiconductors — from standard platforms to specific developments.
From standard platforms to specific developments
The rise of SiC and GaN in power electronics demands increasingly rigorous testing. Whether you need a standard bench tool or a custom system, AMCAD and ITEST provide high-accuracy solutions built to handle the specific voltage, current, and thermal stresses of your application. Our platforms address SiC and GaN devices, power modules, RF power components, semiconductor R&D, and power electronics validation.
Standard platforms
AM3242 Pulsed High-Voltage Unit: The Pulse IV system is a multi-channel Source and Measurement Unit specifically designed for advanced transistor characterization. As a pioneer in pulsed IV measurements for compact transistor modeling, it delivers:
- Voltage range: -50V to 1500V
- Current: -150A to 150A
- DC and pulsed modes, min pulse width 200ns
- Trace measurement function
- Control via IVCAD or SCPI commands
- Easy integration in test bench via Triggers IN/OUT
Micro BiLT Chassis: A versatile modular platform supporting up to 1000W of output power without the need for external bulk supplies. Features include isolated and non-isolated voltage sources, pulsed voltage sources, current sources, heating plates, real-time monitoring with backup memory storage, and a complete software package (BiltLab & EasyStress).
Custom solutions
For specific development programs, our engineering teams deliver tailored systems designed to meet exact qualification requirements, simplifying lab management while reducing costs and accelerating time-to-market.
ATE Systems: Custom automated RF test benches with a unified interface controlling all instruments regardless of brand, and real-time monitoring of test conditions (temperature, humidity, power).
Custom applications include:
- HTRB / HTGB / IOL burn-in test benches for transistors (SiC, GaN)
- RF amplifier reliability tests (GaAs, GaN), DC or pulsed
- Reliability test benches for laser diodes
- Life-tests of automotive connectors (vibration or "slow motion")
- Custom burn-in racks
- Integration of DC and RF environments
- High-density multi-channel aging
- Client-specific test protocols
Target markets
Our solutions address the needs of: Aerospace Electronics, High-Reliability Power Conversion, Automotive Qualification, Defense Systems, and RF Test Environments.
Meet us in Brussels
Our engineers will be available on the booth to discuss your test challenges and explore current and upcoming requirements in power device testing.
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